Chris Breslin

Advisor
Professor Brad Thiel


Research group
Metrology

Research group WEBSITE
http://cnse.albany.edu/facilities/metrology.html

Current Projects
Determining the deposition mechanism(s) using focused beams and developing a model to predict the behavior of the ion/electron interaction with an adsorbed precursor.

Publications
K.A. Dunn, C. Breslin, and B.L. Thiel, “The Influence of Ga+ Ion Dose on Deposition Rate and Purity of Pt Films”, Microscopy and Microanalysis 12(Suppl. 2), 706 (2006).
 

Undergraduate School
University at Albany, State University of New York


Extracurricular Activities
NanoGSO: Coordinator, Assembly Representative, Website Designer

CDMMS: Full member of the Capital District Microscopy and Microanalysis Society

Website Designer:  www.NanoEngineering.tv

Stock Investments, Active Sports